Enhanced reliability of vertical strained impact ionization MOSFET incorporating dielectric pocket for ultra-sensitive biosensor applications

by Ismail Saad, Mohd Zuhir Hamzah, Andee Hazwani Syazana Bacho, C., Bun Seng, A. M. Khairul, Bablu K. Ghosh, Nurmin Bolong
Published 2017

Enhanced performance analysis of vertical strained-sige impact ionization MOSFET (VESIMOS)

by Saad, Ismail, Pogaku, Divya, A. R., Abu Bakar, H., Mohd. Zuhir, Bolon, N., A. M., Khairul, Ghosh, Bablu, Ismai, Razali, Hashim, U.
Published 2012