Simulation study of single event burnout hardening technique on power UMOSFET using P-Island layer

by Krishnamurthy, S., Kannan, R., Azmadi Hussin, F.
Published 2020

Carbon nanotube field effect transistors: an overview of device structure, modeling, fabrication and applications

by Zahoor, F., Hanif, M., Isyaku Bature, U., Bodapati, S., Chattopadhyay, A., Azmadi Hussin, F., Abbas, H., Merchant, F., Bashir, F.
Published 2023