Themis: Automatic and efficient deep learning system testing with strong fault detection capability

by HUANG, Dong, LI, Tsz On, XIE, Xiaofei, CUI, Heming
Published 2024

Neuron sensitivity guided test case selection

by HUANG, Dong, BU, Qingwen, FU, Yichao, QING, Yuhao, XIE, Xiaofei, CHEN, Junjie, CUI, Heming
Published 2024