A new field dependent mobility model for high frequency channel thermal noise of deep submicron RFCMOS

by Ong, Shih Ni, Yeo, Kiat Seng, Chew, Kok Wai Johnny, Chan, L. H. K., Loo, Xi Sung, Boon, Chirn Chye, Do, Manh Anh
Published 2013

MOSFET drain current noise modeling with effective gate overdrive and junction noise

by Chan, L. H. K., Yeo, Kiat Seng, Chew, Kok Wai Johnny, Ong, Shih Ni, Loo, Xi Sung, Boon, Chirn Chye, Do, Manh Anh
Published 2013

Impact of velocity saturation and hot carrier effects on channel thermal noise model of deep sub-micron MOSFETs

by Ong, Shih Ni, Yeo, Kiat Seng, Chew, Kok Wai Johnny, Chan, L. H. K., Loo, Xi Sung, Boon, Chirn Chye, Do, Manh Anh
Published 2013

A new millimeter-wave fixture deembedding method based on generalized cascade network model

by Loo, Xi Sung, Yeo, Kiat Seng, Chew, Kok Wai Johnny, Chan, L. H. K., Ong, Shih Ni, Do, Manh Anh, Boon, Chirn Chye
Published 2013