Obet: On-the-fly byte-level error tracking for correcting and detecting faults in unreliable dram systems

由 Nguyen, Duy-Thanh, Ho, Nhut-Minh, Wong, Weng-Fai, Chang, Ik-Joon
出版 2022

0.2 V 8T SRAM With PVT-Aware Bitline Sensing and Column-Based Data Randomization

由 Do, Anh Tuan, Lee, Zhao Chuan, Wang, Bo, Chang, Ik-Joon, Liu, Xin, Kim, Tony Tae-Hyoung
出版 2016