Automated data collection in single particle electron microscopy

由 Tan, Yong Zi, Cheng, Anchi, Potter, Clinton S, Carragher, Bridget
出版 2022

Routine single particle cryoEM sample and grid characterization by tomography

由 Noble, Alex J, Dandey, Venkata P, Wei, Hui, Braschi, Julia, Chase, Jillian, Acharya, Priyamvada, Tan, Yong Zi, Zhang, Zhening, Kim, Laura Y, Scapin, Giovanna, Rapp, Micah, Eng, Edward T, Rice, William J, Cheng, Anchi, Negro, Carl J, Shapiro, Lawrence, Kwong, Peter D, Jeruzalmi, David, des Georges, Amedee, Potter, Clinton S, Carragher, Bridget
出版 2022