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To investigate the morphological surface of Oasis wound dressing by atomic force microscopy (AFM) and scanning electron microscopy (SEM) techniques

To investigate the morphological surface of Oasis wound dressing by atomic force microscopy (AFM) and scanning electron microscopy (SEM) techniques

by Teo, Chin Chye.
Published 2008

Other Authors: “...Chian, Sandy Kerm Sin...”
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