Showing 1 - 3 results of 3 for search 'IEEE International Conference on Management of Innovation and Technology (1st : 2000 : Singapore)', query time: 0.01s Refine Results
1
Multiple regression models for electronic product success prediction
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2
Typical management shortfalls in New Product Development (NPD) and their avoidance
by Foo, Say Wei, Bauly, John A.
Published 2009
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3
Software risk assessment model
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