Characterization of thick graded Si1-xGex/Si layers grown by low energy plasma enhanced chemical vapour deposition

by Seng, H.L., Breese, M.B.H., Watt, F., Kummer, M., Von Känel, H.
Published 2014

Extremes in the degrees of inferability

by Fortnow, L., Gasarch, W., Jain, S., Kinber, E., Kummer, M., Kurtz, S., Pleszkovich, M., Slaman, T., Solovay, R., Stephan, F.
Published 2014