Investigation of aluminium diffusion into an amorphous silicon thin film at high temperature by in-situ spectroscopic ellipsometry

by W. Luangtip, S. Rotbuathong, P. Chindaudom, M. Horphatum, V. Patthanasetthakul, P. Eiamchai, T. Srikirin
Published 2018

Temperature dependence of optical constants of silver film studied by in situ spectroscopic ellipsometry

by S. Rojebuathong, P. Chindaudom, W. Luangtip, M. Horphatum, P. Eiamchai, V. Patthanasetthakul, P. Limsuwan
Published 2018