Parametrization of the total photon mass attenuation coefficients for photon energies between 100 eV and 1000 MeV

by Orlić, I., Bogdanović, I., Zhou, S., Sanchez, J.L.
Published 2014

Proton micromachining: A new technique for the production of three-dimensional microstructures

by Van Kan, J.A., Sanchez, J.L., Osipowicz, T., Watt, F.
Published 2014

Deep ion beam lithography for micromachining applications

by Springham, S.V., Osipowicz, T., Sanchez, J.L., Lee, S., Watt, F.
Published 2014

VIBA-LAB2: A virtual ion beam analysis laboratory software package incorporating elemental map simulations

by Zhou, S.J., Orlic, I., Sanchez, J.L., Watt, F.
Published 2014

Micro-PIXE analysis of trace element concentrations of natural rubies from different locations in Myanmar

by Sanchez, J.L., Osipowicz, T., Tang, S.M., Tay, T.S., Win, T.T.
Published 2014

Quantitative analysis of cascade impactor samples - revisited

by Orlić, I., Chiam, S.Y., Sanchez, J.L., Tang, S.M.
Published 2014

Virtual PIXE and RBS laboratory

by Orlic, I., Zhou, S., Sanchez, J.L., Watt, F., Tang, S.M.
Published 2014

Micromachining using deep ion beam lithography

by Springham, S.V., Osipowicz, T., Sanchez, J.L., Gan, L.H., Watt, F.
Published 2014

Micromachining using focused high energy ion beams: Deep Ion Beam Lithography

by Van Kan, J.A., Sanchez, J.L., Xu, B., Osipowicz, T., Watt, F.
Published 2014

Resist materials for proton micromachining

by Van Kan, J.A., Sanchez, J.L., Xu, B., Osipowicz, T., Watt, F.
Published 2014

Proton micromachining of substrate scaffolds for cellular and tissue engineering

by Sanchez, J.L., Guy, G., Van Kan, J.A., Osipowicz, T., Watt, F.
Published 2014

A high resolution beam scanning system for deep ion beam lithography

by Sanchez, J.L., Van Kan, J.A., Osipowicz, T., Springham, S.V., Watt, F.
Published 2014

The use of proton microbeams for the production of microcomponents

by Osipowicz, T., Van Kan, J.A., Sum, T.C., Sanchez, J.L., Watt, F.
Published 2014

Ion Beam Induced Charge imaging for the failure analysis of semiconductor devices

by Kolachina, S., Chan, D.S.H., Phang, J.C.H., Osipowicz, T., Sanchez, J.L., Watt, F.
Published 2014

Fluence dependence of IBIC collection efficiency of CMOS transistors

by Osipowicz, T., Sanchez, J.L., Orlic, I., Watt, F., Kolachina, S., Chan, D.S.H., Phang, J.C.H.
Published 2014

Development of the IBIC (Ion Beam Induced Charge) technique for IC failure analysis

by Osipowicz, T., Sanchez, J.L., FWatt, Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H.
Published 2014

TTPIXAN - The 4th generation

by Orlić, I., Loh, K.K., Liew, S.C., Ng, Y.K., Sanchez, J.L., Tang, S.M.
Published 2014

Nuclear microscopy study of fish scales

by Tang, S.M., Orlic, I., Yu, K.N., Sanchez, J.L., Thong, P.S.P., Watt, F., Khoo, H.W.
Published 2014

Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC

by Osipowicz, T., Sanchez, J.L., Orlić, I., Watt, F., Kolachina, S., Ong, V.K.S., Chan, D.S.H., Phang, J.C.H.
Published 2014

Human metapneumovirus, Peru

by Gray, G.C, Capuano, A.W, Setterquist, S.F, Sanchez, J.L, Neville, J.S, Olson, J, Lebeck, M.G.A, McCarthy, T, Abed, Y, Boivin, G
Published 2020