Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements

by Hameiri, Z., Rougieux, F., Sinton, R., Trupke, T.
Published 2016

Effective bulk doping concentration of diffused and undiffused silicon wafers obtained from combined photoconductance and photoluminescence measurements

by Hameiri, Z., Trupke, T., Gao, N., Sinton, R.A., Weber, J.W.
Published 2016

Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime

by Blum, A.L., Swirhun, J.S., Sinton, R.A., Yan, F., Herasimenka, S., Roth, T., Lauer, K., Haunschild, J., Lim, B., Bothe, K., Hameiri, Z., Seipel, B., Xiong, R., Dhamrin, M., Murphy, J.D.
Published 2016

Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime

by Blum, A.L., Swirhun, J.S., Sinton, R.A., Yan, F., Herasimenka, S., Roth, T., Lauer, K., Haunschild, J., Lim, B., Bothe, K., Hameiri, Z., Seipel, B., Xiong, R., Dhamrin, M., Murphy, J.D.
Published 2016