Text this: CONDUCTIVITY OF METAL OXIDE SEMICONDUCTOR (MOS) THIN FILMS DUE TO GAS ADSORPTION PROCESS BY USING POINT DEFECT - AND DIFFUSION THEORIES

 _    _      ___     _    _      ___     __   __  
| |  | ||   / _ \\  | |  | ||   / _ \\   \ \\/ // 
| |/\| ||  / //\ \\ | |/\| ||  | / \ ||   \   //  
|  /\  || |  ___  |||  /\  ||  | \_/ ||   / . \\  
|_// \_|| |_||  |_|||_// \_||   \___//   /_//\_\\ 
`-`   `-` `-`   `-` `-`   `-`   `---`    `-`  --`