Text this: CONDUCTIVITY OF METAL OXIDE SEMICONDUCTOR (MOS) THIN FILMS DUE TO GAS ADSORPTION PROCESS BY USING POINT DEFECT - AND DIFFUSION THEORIES

           __   __    ____       ___              
    ___    \ \\/ //  |  _ \\    / _ \\    ____    
   /   ||   \ ` //   | |_| ||  / //\ \\  |    \\  
  | [] ||    | ||    | .  //  |  ___  || | [] ||  
   \__ ||    |_||    |_|\_\\  |_||  |_|| |  __//  
    -|_||    `-`'    `-` --`  `-`   `-`  |_|`-`   
     `-`                                 `-`