Text this: CONDUCTIVITY OF METAL OXIDE SEMICONDUCTOR (MOS) THIN FILMS DUE TO GAS ADSORPTION PROCESS BY USING POINT DEFECT - AND DIFFUSION THEORIES

 ______    __   __    ____     __   __    ______  
|      \\  \ \\/ //  |  _ \\   \ \\/ //  /_____// 
|  --  //   \ ` //   | |_| ||   \ ` //   `____ `  
|  --  \\    | ||    | .  //     | ||    /___//   
|______//    |_||    |_|\_\\     |_||    `__ `    
`------`     `-`'    `-` --`     `-`'    /_//     
                                         `-`