Automated Classification and Removal of EEG Artifacts With SVM and Wavelet-ICA

• Main Authors: Chong, Yeh Sai, Mokhtar, Norrima, Arof, Hamzah, Cumming, Paul, Iwahashi, Masahiro
• Format: Article
• Published: Institute of Electrical and Electronics Engineers 2018
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.um.edu.my/20815/; https://doi.org/10.1109/JBHI.2017.2723420
• Institution: Universiti Malaya

Brain electrical activity recordings by electroencephalography (EEG) are often contaminated with signal artifacts. Procedures for automated removal of EEG artifacts are frequently sought for clinical diagnostics and brain-computer interface applications. In recent years, a combination of independent...