Probing the Ph measurement of self-alligned polysilicon nanogap capacitor

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Main Authors: Nazwa, Taib, Uda, Hashim, Prof. Dr., Mohammad Nuzaihan, Md Noor
Other Authors: nazawa_nice@yahoo.com
Format: Article
Language:English
Published: Trans Tech Publications 2013
Subjects:
Ph
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/27454
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Institution: Universiti Malaysia Perlis
Language: English
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spelling my.unimap-274542013-08-15T07:46:34Z Probing the Ph measurement of self-alligned polysilicon nanogap capacitor Nazwa, Taib Uda, Hashim, Prof. Dr. Mohammad Nuzaihan, Md Noor nazawa_nice@yahoo.com uda@unimap.edu.my m.nuzaihan@unimap.edu.my Dielectric layer Dielectric properties Nanogap capacitor Ph Thermal oxidation Link to publisher's homepage at http://www.ttp.net/ With their bright potential in effective sensing, nanogap capacitor show promise as a device to measure wider aspect of dielectric properties. In this paper, we demonstrate the effectiveness of nanogap capacitor in detecting the changes of pH measurement via Dielectric analyzer (C-V and C-F characterization) as its stables under each reading and repeatability. The purpose of this paper is to report on the fabrication and electrical characterization of nanogap device. We introduce the conventional lithographic combined with the size expansion technique for the transition from micro (3.13μm) to nano-sized (42nm) gap. The evolution of gaps nanogap pattern expansions were verified by using SEM by controlling the dry oxidation time of device. Then, Ti/Au layer were deposited onto the final device for probing purpose. Different level of pH (3, 5, and 10) has been tested and conformed by repeating each test. About 10 μm of pH liquid were dropped using pipette in the middle of gap probing (2-wire measurements) is done on the Au pad fabricated on the nanogap device. 10 μm of pH liquid were dropped using pipette onto the target and the reading will be taken. Probing is done via dielectric analyzer on the couple of gold pad apart of the capacitive nanogap biosensor to investigate the effect of excitation frequency and voltage on capacitance sampling. 2013-08-15T07:46:34Z 2013-08-15T07:46:34Z 2012 Article Advanced Materials Research, vol. 364, 2012, pages 344-347 978-303785301-6 1022-6680 http://www.scientific.net/AMR.364.344 http://hdl.handle.net/123456789/27454 en Trans Tech Publications
institution Universiti Malaysia Perlis
building UniMAP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Perlis
content_source UniMAP Library Digital Repository
url_provider http://dspace.unimap.edu.my/
language English
topic Dielectric layer
Dielectric properties
Nanogap capacitor
Ph
Thermal oxidation
spellingShingle Dielectric layer
Dielectric properties
Nanogap capacitor
Ph
Thermal oxidation
Nazwa, Taib
Uda, Hashim, Prof. Dr.
Mohammad Nuzaihan, Md Noor
Probing the Ph measurement of self-alligned polysilicon nanogap capacitor
description Link to publisher's homepage at http://www.ttp.net/
author2 nazawa_nice@yahoo.com
author_facet nazawa_nice@yahoo.com
Nazwa, Taib
Uda, Hashim, Prof. Dr.
Mohammad Nuzaihan, Md Noor
format Article
author Nazwa, Taib
Uda, Hashim, Prof. Dr.
Mohammad Nuzaihan, Md Noor
author_sort Nazwa, Taib
title Probing the Ph measurement of self-alligned polysilicon nanogap capacitor
title_short Probing the Ph measurement of self-alligned polysilicon nanogap capacitor
title_full Probing the Ph measurement of self-alligned polysilicon nanogap capacitor
title_fullStr Probing the Ph measurement of self-alligned polysilicon nanogap capacitor
title_full_unstemmed Probing the Ph measurement of self-alligned polysilicon nanogap capacitor
title_sort probing the ph measurement of self-alligned polysilicon nanogap capacitor
publisher Trans Tech Publications
publishDate 2013
url http://dspace.unimap.edu.my/xmlui/handle/123456789/27454
_version_ 1643795280470999040