Characterization study for polymer core solder balls under AC and TC reliability test

Ball grid arrays; Diffusion; Drops; Electronics packaging; Hazardous materials; Hazards; Industrial electronics; Lead-free solders; Polymers; Reliability; Semiconductor device manufacture; Shear strength; Soldered joints; Testing; Thermal conductivity; Thickness measurement; Characterization studies...

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Bibliographic Details
Main Authors: Tan C.H., Yap B.K., Tan C.Y.
Other Authors: 57189468183
Format: Conference Paper
Published: Institute of Electrical and Electronics Engineers Inc. 2023
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Institution: Universiti Tenaga Nasional

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