Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans
This work describes a method to obtain surface microtopography of a material by scanning its capacitance. Capacitance was measured by the three terminal method with the core of a coaxial cable used as the measuring probe while the shielding wire acted as the guard electrode to eliminate the fringin...
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Universiti Putra Malaysia Press
1999
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| Online Access: | http://psasir.upm.edu.my/id/eprint/3490/1/Penentuan_Struktur_Permukaan_dengan_Menggunakan.pdf http://psasir.upm.edu.my/id/eprint/3490/ |
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my.upm.eprints.34902013-05-27T07:08:56Z http://psasir.upm.edu.my/id/eprint/3490/ Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans Wan Yusof, Wan Mohamad Daud Talib, Zainal Abidin Ismail, Mohd Zaid This work describes a method to obtain surface microtopography of a material by scanning its capacitance. Capacitance was measured by the three terminal method with the core of a coaxial cable used as the measuring probe while the shielding wire acted as the guard electrode to eliminate the fringing field effect. From our results, we found that good image resolution is best obtained if the medium used has a high dielectric constant than the sample. Universiti Putra Malaysia Press 1999 Article PeerReviewed application/pdf en http://psasir.upm.edu.my/id/eprint/3490/1/Penentuan_Struktur_Permukaan_dengan_Menggunakan.pdf Wan Yusof, Wan Mohamad Daud and Talib, Zainal Abidin and Ismail, Mohd Zaid (1999) Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans. Pertanika Journal of Science & Technology, 7 (2). pp. 125-131. ISSN 0128-7680 Malay |
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English Malay |
| description |
This work describes a method to obtain surface microtopography of a material by scanning its capacitance. Capacitance was measured by the three terminal
method with the core of a coaxial cable used as the measuring probe while the shielding wire acted as the guard electrode to eliminate the fringing field effect. From our results, we found that good image resolution is best obtained
if the medium used has a high dielectric constant than the sample. |
| format |
Article |
| author |
Wan Yusof, Wan Mohamad Daud Talib, Zainal Abidin Ismail, Mohd Zaid |
| spellingShingle |
Wan Yusof, Wan Mohamad Daud Talib, Zainal Abidin Ismail, Mohd Zaid Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans |
| author_facet |
Wan Yusof, Wan Mohamad Daud Talib, Zainal Abidin Ismail, Mohd Zaid |
| author_sort |
Wan Yusof, Wan Mohamad Daud |
| title |
Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans |
| title_short |
Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans |
| title_full |
Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans |
| title_fullStr |
Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans |
| title_full_unstemmed |
Penentuan Struktur Permukaan dengan Menggunakan Kaedah Kapasitans |
| title_sort |
penentuan struktur permukaan dengan menggunakan kaedah kapasitans |
| publisher |
Universiti Putra Malaysia Press |
| publishDate |
1999 |
| url |
http://psasir.upm.edu.my/id/eprint/3490/1/Penentuan_Struktur_Permukaan_dengan_Menggunakan.pdf http://psasir.upm.edu.my/id/eprint/3490/ |
| _version_ |
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