Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect

Error control schemes became a necessity in network-on-chip (NoC) to improve reliability as the on-chip interconnect errors increase with the continuous shrinking of geometry. Accordingly, many researchers are trying to present multi-bit error correction coding schemes that perform a high error corr...

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Main Authors: Chlaab, Asaad Kadhum, Flayyih, Wameedh Nazar, Rokhani, Fakhrul Zaman
Format: Article
Language:English
Published: University of Baghdad 2020
Online Access:http://psasir.upm.edu.my/id/eprint/87456/1/Reliability%20analysis%20of%20multibit.pdf
http://psasir.upm.edu.my/id/eprint/87456/
https://joe.uobaghdad.edu.iq/index.php/main/article/view/j.eng.2020.06.08
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Institution: Universiti Putra Malaysia
Language: English
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spelling my.upm.eprints.874562022-11-22T09:12:19Z http://psasir.upm.edu.my/id/eprint/87456/ Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect Chlaab, Asaad Kadhum Flayyih, Wameedh Nazar Rokhani, Fakhrul Zaman Error control schemes became a necessity in network-on-chip (NoC) to improve reliability as the on-chip interconnect errors increase with the continuous shrinking of geometry. Accordingly, many researchers are trying to present multi-bit error correction coding schemes that perform a high error correction capability with the simplest design possible to minimize area and power consumption. A recent work, Multi-bit Error Correcting Coding with Reduced Link Bandwidth (MECCRLB), showed a huge reduction in area and power consumption compared to a well-known scheme, namely, Hamming product code (HPC) with Type-II HARQ. Moreover, the authors showed that the proposed scheme can correct 11 random errors which is considered a high number of errors to be corrected by any scheme used in NoC. The high correction capability with moderate number of check bits along with the reduction in power and area requires further investigation in the accuracy of the reliability model. In this paper, reliability analysis is performed by modeling the residual error probability Presidual which represents the probability of decoder error or failure. New model to estimate Presidual of MECCRLB is derived, validated against simulation, and compared to HPC to assess the capability of MECCRLB. The results show that HPC outperforms MECCRLB from reliability perspective. The former corrects all single and double errors, and fails in 5.18% cases of the triple errors, whereas the latter is found to correct all single errors but fails in 32.5% of double errors and 38.97% of triple errors. University of Baghdad 2020-06-01 Article PeerReviewed text en http://psasir.upm.edu.my/id/eprint/87456/1/Reliability%20analysis%20of%20multibit.pdf Chlaab, Asaad Kadhum and Flayyih, Wameedh Nazar and Rokhani, Fakhrul Zaman (2020) Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect. Journal of Engineering, 26 (6). 94 - 106. ISSN 1726-4073; ESSN: 250-3339 https://joe.uobaghdad.edu.iq/index.php/main/article/view/j.eng.2020.06.08 10.31026/j.eng.2020.06.08
institution Universiti Putra Malaysia
building UPM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Putra Malaysia
content_source UPM Institutional Repository
url_provider http://psasir.upm.edu.my/
language English
description Error control schemes became a necessity in network-on-chip (NoC) to improve reliability as the on-chip interconnect errors increase with the continuous shrinking of geometry. Accordingly, many researchers are trying to present multi-bit error correction coding schemes that perform a high error correction capability with the simplest design possible to minimize area and power consumption. A recent work, Multi-bit Error Correcting Coding with Reduced Link Bandwidth (MECCRLB), showed a huge reduction in area and power consumption compared to a well-known scheme, namely, Hamming product code (HPC) with Type-II HARQ. Moreover, the authors showed that the proposed scheme can correct 11 random errors which is considered a high number of errors to be corrected by any scheme used in NoC. The high correction capability with moderate number of check bits along with the reduction in power and area requires further investigation in the accuracy of the reliability model. In this paper, reliability analysis is performed by modeling the residual error probability Presidual which represents the probability of decoder error or failure. New model to estimate Presidual of MECCRLB is derived, validated against simulation, and compared to HPC to assess the capability of MECCRLB. The results show that HPC outperforms MECCRLB from reliability perspective. The former corrects all single and double errors, and fails in 5.18% cases of the triple errors, whereas the latter is found to correct all single errors but fails in 32.5% of double errors and 38.97% of triple errors.
format Article
author Chlaab, Asaad Kadhum
Flayyih, Wameedh Nazar
Rokhani, Fakhrul Zaman
spellingShingle Chlaab, Asaad Kadhum
Flayyih, Wameedh Nazar
Rokhani, Fakhrul Zaman
Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect
author_facet Chlaab, Asaad Kadhum
Flayyih, Wameedh Nazar
Rokhani, Fakhrul Zaman
author_sort Chlaab, Asaad Kadhum
title Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect
title_short Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect
title_full Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect
title_fullStr Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect
title_full_unstemmed Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect
title_sort reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect
publisher University of Baghdad
publishDate 2020
url http://psasir.upm.edu.my/id/eprint/87456/1/Reliability%20analysis%20of%20multibit.pdf
http://psasir.upm.edu.my/id/eprint/87456/
https://joe.uobaghdad.edu.iq/index.php/main/article/view/j.eng.2020.06.08
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