Reliability analysis of multibit error correcting coding and comparison to hamming product code for on-chip interconnect

• Main Authors: Chlaab, Asaad Kadhum, Flayyih, Wameedh Nazar, Rokhani, Fakhrul Zaman
• Format: Article
• Language: English
• Published: University of Baghdad 2020
• Online Access: http://psasir.upm.edu.my/id/eprint/87456/1/Reliability%20analysis%20of%20multibit.pdf; http://psasir.upm.edu.my/id/eprint/87456/; https://joe.uobaghdad.edu.iq/index.php/main/article/view/j.eng.2020.06.08
• Institution: Universiti Putra Malaysia

Error control schemes became a necessity in network-on-chip (NoC) to improve reliability as the on-chip interconnect errors increase with the continuous shrinking of geometry. Accordingly, many researchers are trying to present multi-bit error correction coding schemes that perform a high error corr...