Detecting Resistive-Opens in RRAM using Programmable DfT Scheme

• Main Authors: Nor Zaidi , Haron, Norsuhaidah , Arshad, Sukreen Hana , Herman
• Format: Conference or Workshop Item
• Language: English
• Published: 2013
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utem.edu.my/id/eprint/10106/1/ASQED13.pdf; http://eprints.utem.edu.my/id/eprint/10106/
• Institution: Universiti Teknikal Malaysia Melaka

Resistive Random Access Memory (RRAM) is one of the emerging memory devices that possesses a combined attribute of SRAM, DRAM and flash. How- ever, as the technology and fabrication process of such a promising memory devices are still immature, RRAM is expected to be impacted by process-variati...