Carbonization layer grown by acetylene reaction on SI(100) and (111) surface using low pressure chemical vapor deposition
Surface carbonization on Si(100) and Si(111) using acetylene as single carbon source was performed in a low-pressure chemical vapor deposition chamber using rapid thermal technique. The dependences of crystallinity, crystal orientation and bonding state of carbonization layer on acetylene flow rates...
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2009
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my.utm.133492017-11-01T04:17:20Z http://eprints.utm.my/id/eprint/13349/ Carbonization layer grown by acetylene reaction on SI(100) and (111) surface using low pressure chemical vapor deposition Hashim, Abdul manaf Kanji, Yasui TK Electrical engineering. Electronics Nuclear engineering Surface carbonization on Si(100) and Si(111) using acetylene as single carbon source was performed in a low-pressure chemical vapor deposition chamber using rapid thermal technique. The dependences of crystallinity, crystal orientation and bonding state of carbonization layer on acetylene flow rates, pressures, temperatures and times were evaluated using X-ray diffractometry and electron probe microanalysis analytical techniques. The stoichiometric carbonization layer with good crystallinity, crystal orientation and bonding state was successfully formed at 1100 °C with C2H2 flow rate of 2 sccm and reaction pressure of 0.3 Torr. Penerbit UTM Press 2009-06 Article PeerReviewed application/pdf en http://eprints.utm.my/id/eprint/13349/1/AbdulManafHashim2009_CarbonizationLayerGrownbyAcetyleneReaction.pdf text/html en http://eprints.utm.my/id/eprint/13349/2/164 Hashim, Abdul manaf and Kanji, Yasui (2009) Carbonization layer grown by acetylene reaction on SI(100) and (111) surface using low pressure chemical vapor deposition. Jurnal Teknologi, 50 (D). pp. 23-32. ISSN 2180-3722 http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:67934 DOI:10.11113/jt.v50.164 |
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TK Electrical engineering. Electronics Nuclear engineering Hashim, Abdul manaf Kanji, Yasui Carbonization layer grown by acetylene reaction on SI(100) and (111) surface using low pressure chemical vapor deposition |
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Surface carbonization on Si(100) and Si(111) using acetylene as single carbon source was performed in a low-pressure chemical vapor deposition chamber using rapid thermal technique. The dependences of crystallinity, crystal orientation and bonding state of carbonization layer on acetylene flow rates, pressures, temperatures and times were evaluated using X-ray diffractometry and electron probe microanalysis analytical techniques. The stoichiometric carbonization layer with good crystallinity, crystal orientation and bonding state was successfully formed at 1100 °C with C2H2 flow rate of 2 sccm and reaction pressure of 0.3 Torr. |
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Article |
author |
Hashim, Abdul manaf Kanji, Yasui |
author_facet |
Hashim, Abdul manaf Kanji, Yasui |
author_sort |
Hashim, Abdul manaf |
title |
Carbonization layer grown by acetylene reaction on SI(100) and (111) surface using low pressure chemical vapor deposition |
title_short |
Carbonization layer grown by acetylene reaction on SI(100) and (111) surface using low pressure chemical vapor deposition |
title_full |
Carbonization layer grown by acetylene reaction on SI(100) and (111) surface using low pressure chemical vapor deposition |
title_fullStr |
Carbonization layer grown by acetylene reaction on SI(100) and (111) surface using low pressure chemical vapor deposition |
title_full_unstemmed |
Carbonization layer grown by acetylene reaction on SI(100) and (111) surface using low pressure chemical vapor deposition |
title_sort |
carbonization layer grown by acetylene reaction on si(100) and (111) surface using low pressure chemical vapor deposition |
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Penerbit UTM Press |
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2009 |
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http://eprints.utm.my/id/eprint/13349/1/AbdulManafHashim2009_CarbonizationLayerGrownbyAcetyleneReaction.pdf http://eprints.utm.my/id/eprint/13349/2/164 http://eprints.utm.my/id/eprint/13349/ http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:67934 |
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