Neural network paradigm for classification of defects on PCB

• Main Authors: Heriansyah, Rudi, Syed Al-Attas, Syed Abdul Rahman, Zabidi, Muhammad Mun'im Ahmad
• Format: Article
• Language: English
• Published: Penerbit UTM Press 2003
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/2086/1/JTMKK39%28D%29bab9.pdf; http://eprints.utm.my/id/eprint/2086/
• Institution: Universiti Teknologi Malaysia

A new technique is proposed to classify the defects that could occur on the PCB using neural network paradigm. The algorithms to segment the image into basic primitive patterns, enclosing the primitive patterns, patterns assignment, patterns normalization, and classification have been developed base...