Carbonization layer obtained by acetylene reaction with Si (100) and (111) surface using low pressure chemical vapor deposition
Surface carbonization on Si (100) and Si (111) using acetylene as single carbon source was performed in a low-pressure chemical vapor deposition chamber using rapid thermal technique. The dependence of crystallinity, crystal orientation and bonding state of carbonization layer on acetylene flow rate...
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2008
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my.utm.259192018-03-22T10:51:04Z http://eprints.utm.my/id/eprint/25919/ Carbonization layer obtained by acetylene reaction with Si (100) and (111) surface using low pressure chemical vapor deposition Hashim, Abdul Manaf TK Electrical engineering. Electronics Nuclear engineering Surface carbonization on Si (100) and Si (111) using acetylene as single carbon source was performed in a low-pressure chemical vapor deposition chamber using rapid thermal technique. The dependence of crystallinity, crystal orientation and bonding state of carbonization layer on acetylene flow rates, pressures, temperatures and times were evaluated using X-ray diffractometry and electron probe microanalysis analytical techniques. The stoichiometric carbonization layer with good crystallinity, crystal orientation and bonding state was successfully formed at 1100°C with C2H2 flow rate of 2 sccm and reaction pressure of 0.3 Torr. Asian Network for Scientific Information 2008 Article PeerReviewed Hashim, Abdul Manaf (2008) Carbonization layer obtained by acetylene reaction with Si (100) and (111) surface using low pressure chemical vapor deposition. Journal of Applied Sciences, 8 (19). pp. 3473-3478. ISSN 1812-5654 http://scialert.net/qredirect.php?doi=jas.2008.3473.3478&linkid=pdf doi:10.3923/jas.2008.3473.3478 |
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TK Electrical engineering. Electronics Nuclear engineering Hashim, Abdul Manaf Carbonization layer obtained by acetylene reaction with Si (100) and (111) surface using low pressure chemical vapor deposition |
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Surface carbonization on Si (100) and Si (111) using acetylene as single carbon source was performed in a low-pressure chemical vapor deposition chamber using rapid thermal technique. The dependence of crystallinity, crystal orientation and bonding state of carbonization layer on acetylene flow rates, pressures, temperatures and times were evaluated using X-ray diffractometry and electron probe microanalysis analytical techniques. The stoichiometric carbonization layer with good crystallinity, crystal orientation and bonding state was successfully formed at 1100°C with C2H2 flow rate of 2 sccm and reaction pressure of 0.3 Torr. |
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Article |
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Hashim, Abdul Manaf |
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Hashim, Abdul Manaf |
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Hashim, Abdul Manaf |
title |
Carbonization layer obtained by acetylene reaction with Si (100) and (111) surface using low pressure chemical vapor deposition |
title_short |
Carbonization layer obtained by acetylene reaction with Si (100) and (111) surface using low pressure chemical vapor deposition |
title_full |
Carbonization layer obtained by acetylene reaction with Si (100) and (111) surface using low pressure chemical vapor deposition |
title_fullStr |
Carbonization layer obtained by acetylene reaction with Si (100) and (111) surface using low pressure chemical vapor deposition |
title_full_unstemmed |
Carbonization layer obtained by acetylene reaction with Si (100) and (111) surface using low pressure chemical vapor deposition |
title_sort |
carbonization layer obtained by acetylene reaction with si (100) and (111) surface using low pressure chemical vapor deposition |
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Asian Network for Scientific Information |
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2008 |
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http://eprints.utm.my/id/eprint/25919/ http://scialert.net/qredirect.php?doi=jas.2008.3473.3478&linkid=pdf |
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