Pavlov, A., & Sachdev, M. (2017). CMOS SRAM circuit design and parametric test in nano-scaled technologies: Process-aware SRAM design and test. Springer.
استشهاد بنمط شيكاغوPavlov, Andrei, و Manoj Sachdev. CMOS SRAM Circuit Design and Parametric Test in Nano-scaled Technologies: Process-aware SRAM Design and Test. Springer, 2017.
MLA استشهادPavlov, Andrei, و Manoj Sachdev. CMOS SRAM Circuit Design and Parametric Test in Nano-scaled Technologies: Process-aware SRAM Design and Test. Springer, 2017.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.