Tan, C. M., Fu, C., & Engineering, S. o. E. a. E. (2013). Effectiveness of reservoir length on electromigration lifetime enhancement for ULSI interconnects with advanced technology nodes.
Chicago Style CitationTan, Cher Ming, Chunmiao Fu, and School of Electrical and Electronic Engineering. Effectiveness of Reservoir Length On Electromigration Lifetime Enhancement for ULSI Interconnects With Advanced Technology Nodes. 2013.
MLA引文Tan, Cher Ming, Chunmiao Fu, and School of Electrical and Electronic Engineering. Effectiveness of Reservoir Length On Electromigration Lifetime Enhancement for ULSI Interconnects With Advanced Technology Nodes. 2013.
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