Tan, C. M., Fu, C., & Engineering, S. o. E. a. E. (2013). Effectiveness of reservoir length on electromigration lifetime enhancement for ULSI interconnects with advanced technology nodes.
استشهاد بنمط شيكاغوTan, Cher Ming, Chunmiao Fu, و School of Electrical and Electronic Engineering. Effectiveness of Reservoir Length On Electromigration Lifetime Enhancement for ULSI Interconnects With Advanced Technology Nodes. 2013.
MLA استشهادTan, Cher Ming, Chunmiao Fu, و School of Electrical and Electronic Engineering. Effectiveness of Reservoir Length On Electromigration Lifetime Enhancement for ULSI Interconnects With Advanced Technology Nodes. 2013.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.