發送短信 : Effectiveness of reservoir length on electromigration lifetime enhancement for ULSI interconnects with advanced technology nodes

 __   _     _____              __   __   _    _   
| || | ||  |  ___||     ___    \ \\/ // | |  | || 
| '--' ||  | ||__      /   ||   \ ` //  | |/\| || 
| .--. ||  | ||__     | [] ||    | ||   |  /\  || 
|_|| |_||  |_____||    \__ ||    |_||   |_// \_|| 
`-`  `-`   `-----`      -|_||    `-`'   `-`   `-` 
                         `-`