Reachability-based robustness verification and optimization of SRAM dynamic stability under process variations

• Main Authors: Song, Yang, Yu, Hao, DinakarRao, Sai Manoj Pudukotai
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2014
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/103118; http://hdl.handle.net/10220/19254
• Institution: Nanyang Technological University

The dynamic stability margin of SRAM is largely suppressed at nanoscale due to not only dynamic noise but also process variation. This paper introduces an analog verification for SRAM dynamic stability under threshold-voltage variations. A zonotope-based reachability analysis by the backward Euler m...