Zhang, X., & Chin, E. H. L. (2008). Path oriented boolean test generation for single stuck-at fault in combinational circuits.
استشهاد بنمط شيكاغوZhang, Xudong, و Edward Hsi Ling Chin. Path Oriented Boolean Test Generation for Single Stuck-at Fault in Combinational Circuits. 2008.
MLA استشهادZhang, Xudong, و Edward Hsi Ling Chin. Path Oriented Boolean Test Generation for Single Stuck-at Fault in Combinational Circuits. 2008.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.