APA Citation

Zhang, X., & Chin, E. H. L. (2008). Path oriented boolean test generation for single stuck-at fault in combinational circuits.

Chicago Style Citation

Zhang, Xudong, and Edward Hsi Ling Chin. Path Oriented Boolean Test Generation for Single Stuck-at Fault in Combinational Circuits. 2008.

MLA Citation

Zhang, Xudong, and Edward Hsi Ling Chin. Path Oriented Boolean Test Generation for Single Stuck-at Fault in Combinational Circuits. 2008.

Warning: These citations may not always be 100% accurate.