Chew, J. K. W., & Rofail, S. (2008). Analytical and experimental characterization of sub-half micron MOS devices.
Chicago Style CitationChew, Johnny Kok Wai., and Samir Rofail. Analytical and Experimental Characterization of Sub-half Micron MOS Devices. 2008.
MLA CitationChew, Johnny Kok Wai., and Samir Rofail. Analytical and Experimental Characterization of Sub-half Micron MOS Devices. 2008.
Warning: These citations may not always be 100% accurate.