APA引文

Chew, J. K. W., & Rofail, S. (2008). Analytical and experimental characterization of sub-half micron MOS devices.

Chicago Style Citation

Chew, Johnny Kok Wai., and Samir Rofail. Analytical and Experimental Characterization of Sub-half Micron MOS Devices. 2008.

MLA引文

Chew, Johnny Kok Wai., and Samir Rofail. Analytical and Experimental Characterization of Sub-half Micron MOS Devices. 2008.

警告：這些引文格式不一定是100％准確.