Tan, W. J., & Hee, S. B. (2020). Impedance and parasitic capacitance analysis of SiC MOSFETs. Nanyang Technological University.
استشهاد بنمط شيكاغوTan, Wei Jie, و Soong Boon Hee. Impedance and Parasitic Capacitance Analysis of SiC MOSFETs. Nanyang Technological University, 2020.
MLA استشهادTan, Wei Jie, و Soong Boon Hee. Impedance and Parasitic Capacitance Analysis of SiC MOSFETs. Nanyang Technological University, 2020.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.