Tan, W. J., & Hee, S. B. (2020). Impedance and parasitic capacitance analysis of SiC MOSFETs. Nanyang Technological University.
Chicago Style CitationTan, Wei Jie, and Soong Boon Hee. Impedance and Parasitic Capacitance Analysis of SiC MOSFETs. Nanyang Technological University, 2020.
MLA引文Tan, Wei Jie, and Soong Boon Hee. Impedance and Parasitic Capacitance Analysis of SiC MOSFETs. Nanyang Technological University, 2020.
警告:這些引文格式不一定是100%准確.