Machine learning models for patent examination

• المؤلف الرئيسي: Wang, Yanqing
• مؤلفون آخرون: Lihui CHEN
• التنسيق: Thesis-Master by Coursework
• اللغة: English
• منشور في: Nanyang Technological University 2020
• الموضوعات: Engineering::Computer science and engineering::Computer systems organization::Computer-communication networks
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/141313
• المؤسسة: Nanyang Technological University

This year, text classification remains one of the most attractive research topics in the field of NLP(Natural Language Processing). Due to the complexity of patent classification, Patent Examination is still inseparable from the examiners, which makes the efficiency of Patent Examination ineffici...