Image processing and machine learning for IC image analysis and hardware assurance

• 主要作者: Cheng, Deruo
• 其他作者: Gwee Bah Hwee
• 格式: Thesis-Doctor of Philosophy
• 語言: English
• 出版: Nanyang Technological University 2021
• 主題: Engineering::Electrical and electronic engineering::Integrated circuits; Engineering::Computer science and engineering::Computing methodologies::Image processing and computer vision
• 在線閱讀: https://hdl.handle.net/10356/148478
• 機構: Nanyang Technological University

Integrated Circuit (IC) image analysis consists of several major steps including IC delayering, IC imaging, image annotation, schematic generation, and functional analysis. IC image analysis is one of the highly reliable approaches towards hardware assurance, such as failure analysis, functional ver...