Lim, G. Z. Y., & Jun, L. (2022). Finding bugs inside IoT devices via static analysis. Nanyang Technological University.
Chicago Style CitationLim, Gerald Ze Yang, and Luo Jun. Finding Bugs Inside IoT Devices Via Static Analysis. Nanyang Technological University, 2022.
MLA CitationLim, Gerald Ze Yang, and Luo Jun. Finding Bugs Inside IoT Devices Via Static Analysis. Nanyang Technological University, 2022.
Warning: These citations may not always be 100% accurate.