APA引文

Lim, G. Z. Y., & Jun, L. (2022). Finding bugs inside IoT devices via static analysis. Nanyang Technological University.

Chicago Style Citation

Lim, Gerald Ze Yang, and Luo Jun. Finding Bugs Inside IoT Devices Via Static Analysis. Nanyang Technological University, 2022.

MLA引文

Lim, Gerald Ze Yang, and Luo Jun. Finding Bugs Inside IoT Devices Via Static Analysis. Nanyang Technological University, 2022.

警告：這些引文格式不一定是100％准確.