Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern

• المؤلفون الرئيسيون: Chan, Eng Aik, Rendón-Barraza, Carolina, Wang, Benquan, Pu, Tanchao, Ou, Jun-Yu, Wei, Hongxin, Adamo, Giorgio, An, Bo, Zheludev, Nikolay I.
• مؤلفون آخرون: School of Physical and Mathematical Sciences
• التنسيق: مقال
• اللغة: English
• منشور في: 2023
• الموضوعات: Engineering::Nanotechnology; Nnanoparticle Counting; Nanoparticle Imaging
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/169651

Particle counting is of critical importance for nanotechnology, environmental monitoring, pharmaceutical, food and semiconductor industries. Here we introduce a super-resolution single-shot optical method for counting and mapping positions of subwavelength particles on a surface. The method is based...