Zhang, S. S., Rajendran, A., Chae, S. H., Zhang, S., Pan, T., Hone, J. C., . . . Engineering, S. o. E. a. E. (2023). Nano-infrared imaging of metal insulator transition in few-layer 1T-TaS₂.
استشهاد بنمط شيكاغوZhang, Songtian S., Anjaly Rajendran, Sang Hoon Chae, Shuai Zhang, Tsai-Chun Pan, James C. Hone, Cory R. Dean, D. N. Basov, و School of Electrical and Electronic Engineering. Nano-infrared Imaging of Metal Insulator Transition in Few-layer 1T-TaS₂. 2023.
MLA استشهادZhang, Songtian S., et al. Nano-infrared Imaging of Metal Insulator Transition in Few-layer 1T-TaS₂. 2023.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.