Sim, Z. L., Chin, W. M., Bong, Y. X., Goh, D. E. H., Ngwan, V. C., & Engineering, S. o. M. S. a. (2024). Characterization of oxide interface charges in trench field stop IGBT.

Sim, Zhi Lin, Wei Mien Chin, Yi Xiang Bong, David Eng Hui Goh, Voon Cheng Ngwan, و School of Materials Science and Engineering. Characterization of Oxide Interface Charges in Trench Field Stop IGBT. 2024.

Sim, Zhi Lin, et al. Characterization of Oxide Interface Charges in Trench Field Stop IGBT. 2024.