APA引文

Sim, Z. L., Chin, W. M., Bong, Y. X., Goh, D. E. H., Ngwan, V. C., & Engineering, S. o. M. S. a. (2024). Characterization of oxide interface charges in trench field stop IGBT.

Chicago Style Citation

Sim, Zhi Lin, Wei Mien Chin, Yi Xiang Bong, David Eng Hui Goh, Voon Cheng Ngwan, and School of Materials Science and Engineering. Characterization of Oxide Interface Charges in Trench Field Stop IGBT. 2024.

MLA引文

Sim, Zhi Lin, et al. Characterization of Oxide Interface Charges in Trench Field Stop IGBT. 2024.