Nguyen, T. T., & Yucel, A. C. (2024). Deep learning algorithm to detect tree defects via circular scans. Nanyang Technological University.
استشهاد بنمط شيكاغوNguyen, Thanh Tin, و Abdulkadir C. Yucel. Deep Learning Algorithm to Detect Tree Defects Via Circular Scans. Nanyang Technological University, 2024.
MLA استشهادNguyen, Thanh Tin, و Abdulkadir C. Yucel. Deep Learning Algorithm to Detect Tree Defects Via Circular Scans. Nanyang Technological University, 2024.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.