Taxonomy, clustering, and classification of integrated circuit image datasets for deep learning
In the ever-evolving landscape of the semiconductor industry, the integrity of Integrated Circuits (ICs) is critical to technological efficacy and advancement. As such, ensuring the quality of ICs is a high-stakes endeavour where accuracy and precision are paramount. This project introduces a compre...
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| 主要作者: | |
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| 其他作者: | |
| 格式: | Final Year Project |
| 語言: | English |
| 出版: |
Nanyang Technological University
2024
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| 主題: | |
| 在線閱讀: | https://hdl.handle.net/10356/177344 |
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