Lu, Y., & Weiguang, Z. (2008). High-k hafnium oxide based thin films using laser molecular beam epitaxy for gate dielectrics.
Chicago Style CitationLu, Yuekang, and Zhu Weiguang. High-k Hafnium Oxide Based Thin Films Using Laser Molecular Beam Epitaxy for Gate Dielectrics. 2008.
MLA CitationLu, Yuekang, and Zhu Weiguang. High-k Hafnium Oxide Based Thin Films Using Laser Molecular Beam Epitaxy for Gate Dielectrics. 2008.
Warning: These citations may not always be 100% accurate.