Tan, Y. C., & Ming, T. C. (2011). Electromigration study of through silicon via (TSV).
Chicago Style CitationTan, Yeow Chong, and Tan Cher Ming. Electromigration Study of Through Silicon Via (TSV). 2011.
MLA CitationTan, Yeow Chong, and Tan Cher Ming. Electromigration Study of Through Silicon Via (TSV). 2011.
Warning: These citations may not always be 100% accurate.