Lai, S. C. S., & Shenp, A. D. (2011). Negative-bias temperature instability (NBTI) characterization of MOSFETS employing decoupled-plasma-nitrided gate oxides.
استشهاد بنمط شيكاغوLai, Simon Chung Sing, و Ang Diing Shenp. Negative-bias Temperature Instability (NBTI) Characterization of MOSFETS Employing Decoupled-plasma-nitrided Gate Oxides. 2011.
MLA استشهادLai, Simon Chung Sing, و Ang Diing Shenp. Negative-bias Temperature Instability (NBTI) Characterization of MOSFETS Employing Decoupled-plasma-nitrided Gate Oxides. 2011.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.