Lai, S. C. S., & Shenp, A. D. (2011). Negative-bias temperature instability (NBTI) characterization of MOSFETS employing decoupled-plasma-nitrided gate oxides.
Chicago Style CitationLai, Simon Chung Sing, and Ang Diing Shenp. Negative-bias Temperature Instability (NBTI) Characterization of MOSFETS Employing Decoupled-plasma-nitrided Gate Oxides. 2011.
MLA引文Lai, Simon Chung Sing, and Ang Diing Shenp. Negative-bias Temperature Instability (NBTI) Characterization of MOSFETS Employing Decoupled-plasma-nitrided Gate Oxides. 2011.
警告：這些引文格式不一定是100％准確.